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Faculty Profile

To Dr. Gielisse's Web Page
E-mail address: gielisse@eng.fsu.edu
250 CEB, (850) 410-6350

Peter J. Gielisse, Professor of Mechanical Engineering, received his Ph.D. from the Ohio State University in 1961. He also holds an M.S. from Boston College (1959), and a B.M. degree from the College of Maritime Engineering, Netherlands, (1953). Prior to joining the Department of Mechanical Engineering, he served as Visiting Professor, Eindhoven University of Technology, 1974-1975; Professor, University of Rhode Island 1968-1980, President, Capital Technologies, International, Inc., 1985-1987; President, LCE Ltd, 1980-1985; Advisor, United Nations Development Programs (UNDP), 1975-1976; Manager, Abrasive Systems, General Electric Company, 1963-1968; and Research Physicist, Air Force Cambridge Research Laboratories, 1960-1963. He has been nationally recognized as Outstanding Educator of the Year, 1971, was an awardee in the "100 Best Products of the Year" national competition and is a Fellow of the American Ceramic Society. Dr. Gielisse teaches undergraduate and graduate courses in materials science and engineering. He conducts research in superconducting materials, ceramics, composite materials and thin film structures, and directs the Materials Processing and Applications Laboratory.


Published Articles
  • P. J. Gielisse, "Mechanical properties of Diamond-Diamond Films and Related Materials", Handbook of Diamond Properties, Eds. M.J.Prelas, K. Bigelow and G. Popovici, Marcel Dekker N.Y., N.Y. (1996)
  • H. Niculescu, A. saenz, M. Khankhasayev, and P.J. Gielisse, "Self Fields and Current Distributions in Ceramic Superconductors", Physica C, April (1996)
  • M.Tu, P.J. Gielisse and W. Xu, "Grating Holographic Interferometry for Three Dimensional Displacement Measurements, "SEM 50th Anniversary Spring Conference on Experimental Mechanics, Dearbon, Michigan, 1993. Proceedings 50th Anniversary Spring Conference on Experimental Mechanics, Soc.Exp.Mech.,(1996)
  • P.J. Gielisse, M. Tu, Y. Xu and I. Kulisic,"The Role of Surface Characterization in Multilayer Electronic Structures,"North Florida Chapter of ISHM 1995 Technical Symposium, March 21, Orlando, Florida. Proceedings ISHM'95 A3 (1995)
  • M.Tu, Y. Xu,and P.J. Gielisse, "Thermal Expansion of High Temperature Superconducting Tapes by Digital Micro-Image processing", SEM Spring Conference on Experimental Mechanics, Grand Rapids, Michigan, June (1995)

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